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Research On Testing Technology Of PCB Substrate Dielectric Parameters Based On DSPSL

Posted on:2022-04-28Degree:MasterType:Thesis
Country:ChinaCandidate:T PengFull Text:PDF
GTID:2518306524985939Subject:Master of Engineering
Abstract/Summary:PDF Full Text Request
The 5th-Generation,referred to as 5G,is the main direction of the development of communication technology nowadays.With the popularization and commercialization of5 G,the application of substrate materials for 5G communication has become one of the key problems restricting the development of new generation communication technology in China.In the design of high frequency microwave circuit or microwave devices,it is necessary to know the dielectric parameters of the vertical direction of the substrate material used in the circuit.However,there is no perfect test equipment on the market to measure the dielectric parameters of the vertical direction of the substrate at high frequency,so it is necessary to design a test system that can accurately measure the dielectric parameters of the vertical direction of the substrate at high frequency.On the basis of extensive investigation of the research dynamics in the field of material testing,according to the actual needs of the subject,the double-sided parallel strip line(DSPSL)resonator method is used to study the dielectric parameter test technology of the PCB substrate in the vertical direction at high frequency.First of all,this article points out the background and significance of the subject,and illustrates the importance of high-frequency measurement of dielectric parameters of PCB substrate.Then,the development status of domestic and abroad of dielectric parameter testing technology for dielectric materials is presented.Then the basic theory of the double-sided parallel strip line is introduced,including the structure characteristics,field distribution and basic characteristics of the double-sided parallel strip line.Secondly,DSPSL resonator is theoretically analyzed and designed.The DSPSL resonator is simulated by HFSS to verify the feasibility of the method.Then,the electromagnetic simulation software is used to design the microwave devices required by the dielectric parameter test system,including waveguide adapter,coupling probe,conversion circuit,etc.,and the physical objects are processed to establish the hardware test system for testing.Finally,the dielectric parameter test system of PCB substrate based on DSPSL resonator is integrated,and the test software is written according to the test theory.Several samples are measured by DSPSL resonator dielectric parameter test system,and the test results are good.The measurement results of the two isotropic samples are compared with those of the quasi-optical resonator.According to the error theory,the test error of the whole system is analyzed in detail.The dielectric parameters test system established in this paper can measure the vertical dielectric properties of substrate materials in the frequency range of 10 ? 40 GHz and 65 ? 110 GHz at room temperature.The test operation is convenient and the requirements for samples are not high,and the test results are accurate.It provides a new way for high frequency test of vertical dielectric properties of substrate materials.
Keywords/Search Tags:complex dielectric constant, DSPSL, resonator method, high-frequency test
PDF Full Text Request
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