Research On The Characteristics Of DRAM PUF Under The Influence Of SOC Behavior

Using PUF(Physical Unclonable Functions),the unique PUF information of the device can be extracted as an exclusive physical fingerprint for security authentication and other applications.In recent years,PUF has become a hot topic in the field of hardware information security due to its real-time readability,unpredictability and non-cloning characteristics.DRAM PUF(Dynamic Random Access Memory PUF),as an inherent PUF that can be applied to embedded devices,has demonstrated stronger application extensibility.At present,due to the advantage of space saving of the Po P(Package on Package),DRAM PUF is widely used in the packaging of DRAM and SoC(System-on-a-Chip)chips.With the deepening of research,the researcher has proposed that under such a special packaging method,the working behavior of the SoC at the bottom of the package will affect the upper DRAM PUF.The internal relationship between the generation characteristics of DRAM PUF and the SoC behavior has become worth exploring topic.In this paper,a dedicated DRAM PUF implementation based on Raspberry Pi B+,whose SoC and DRAM are packaged in Po P format,is proposed for the study of the characteristics of DRAM PUF under the influence of SoC behavior.A supporting and efficient automated experimental test platform is designed.Based on the experimental platform,multi-function execution scheme and frequency change scheme are proposed,the influence of different SoC working behaviors on the DRAM PUF characteristics during the decay time is researched.A large number of experimental results show that the flip rate of DRAM PUF will increase with the increase of SoC power consumption,and can even distinguish small differences between similar SoC behaviors.In addition,experiments show that even under the influence of SoC's behaviour,the reliability of DRAM PUF still maintains a high level of more than 95%.The uniqueness value between different devices is maintained at an ideal level of 10^-4.This article creatively proposes that in the Po P packaging scenario,through the study of the internal relationship between SoC working behavior and DRAM PUF.A theoretical basis for the research of DRAM PUF as a convert channel or other security issues is provided.In addition,the research results of this paper also provide room for further research on the research of the reliability characteristics of DRAM PUF such as key extraction.