A functional-test specification language

Each digital circuit that is manufactured must be tested to ensure that it conforms to its specification. In spite of advances in Automatic Test Pattern Generation, for most circuits, a set of stimuli and expected responses must be created by a human being. The concept, syntax and vocabulary of existing languages for specifying functional tests are not adequate for the complexity of present-day digital circuits.;The translation of test programs to the language of automatic test equipment is also discussed, and two methods are proposed: one based on known technology, the other, on a more speculative rule-based system.;This thesis considers the features that should be part of a test-specification language, develops a language, and verifies its suitability by creating a functional test for a serial communications circuit.