| Each digital circuit that is manufactured must be tested to ensure that it conforms to its specification. In spite of advances in Automatic Test Pattern Generation, for most circuits, a set of stimuli and expected responses must be created by a human being. The concept, syntax and vocabulary of existing languages for specifying functional tests are not adequate for the complexity of present-day digital circuits.;The translation of test programs to the language of automatic test equipment is also discussed, and two methods are proposed: one based on known technology, the other, on a more speculative rule-based system.;This thesis considers the features that should be part of a test-specification language, develops a language, and verifies its suitability by creating a functional test for a serial communications circuit. |
