| The Atomic Force Microscope (AFM) is capable of directly imaging the morphology and microstructure of surfaces on a nanometer scale. In this thesis, the AFM was applied to a variety of ceramic systems, including the reconstruction and faceting behavior of the TiO;The faceting and reconstruction behavior of the TiO;The development of surface morphology with oxidation was studied on VC;The morphology of rf-sputter deposited SnO... |
