Font Size: a A A

Research And Application Of Digital-analog Hybrid Circuit Test Strategy Optimization Method

Posted on:2021-01-16Degree:MasterType:Thesis
Country:ChinaCandidate:L DuFull Text:PDF
GTID:2428330623968597Subject:Instrumentation engineering
Abstract/Summary:PDF Full Text Request
As the technological level of the electronics industry continues to improve and the integration of electronic circuits continues to rise,it has become a trend that traditional analog circuit technology is replaced by digital-analog hybrid circuit technology.Integrating the analog circuit and the digital circuit on the same circuit board can certainly improve the circuit performance while reducing the size and cost of the circuit board,and also brings new challenges to the test circuit status and performance.In this context,in order to improve the maintainability and reliability of electronic systems,testability issues should be considered at the system design stage.In order to solve the problem that it is difficult for the digital-analog hybrid circuit to unify the analog signal and the digital signal in the same mathematical framework,this paper proposes the discrete event system(Discrete Event System)theory to model the digital-analog hybrid circuit,and based on the modeling results In the above,the circuit test strategy optimization algorithm is studied,and the algorithm generates the test sequence with the smallest average test cost to diagnose the circuit.The main research contents of this article are as follows:1.Introduce the mathematical model of circuit fault diagnosis based on DES theory,and describe the DES model parameter analysis method based on circuit mode and impact analysis,including classification,acquisition and applicability analysis of the failure mode,as well as the failure construction through Saber software Module and fault injection,and finally through a certain digital-analog hybrid circuit for instance analysis of DES model establishment.2.Research the optimization of test strategy based on the DES model.For the commonly used heuristic search AO* algorithm to solve this problem,the heuristic function can determine the test result and computational efficiency of the algorithm.After introducing the commonly used Huffman coding-based heuristic function,this paper proposes that it is based on traditional information entropy To improve the heuristic function of test information entropy,in order to reduce redundant search,a heuristic search algorithm combining test information entropy and dynamic programming is proposed,and its effectiveness is verified through experiments.3.In engineering practice,the parameters of the DES model will change.However,it takes too long to regenerate the event sequence and build the fault diagnosis tree.To avoid this problem,this paper proposes an algorithm to partially adjust the generated fault diagnosis tree.Can effectively improve the efficiency of generating a new fault tree.4.Completed the design and implementation of the test strategy automatic generation software.The software is mainly divided into three modules: information extraction and analysis,test strategy generation,and result analysis and display.Finally,the function of the software is verified through a digital-analog hybrid circuit as an example.
Keywords/Search Tags:Digital-analog hybrid circuit, optimization of test strategies, AO* algorithm
PDF Full Text Request
Related items