Design Of IGCT Static And Dynamic Characteristics Test Circuit

Integrated Gate Commutated Thyristor(IGCT)is a high-power semiconductor device composed of Gate Commutated Thyristor(GCT)and gate drive unit.Due to its high current handling capacity and low conduction and switching losses IGCT has been widely used,so the development of test equipment is very necessary for device application and characterization of device characteristics.This paper takes 4.5kV/2kA IGCT as the research object,and designs its static and dynamic characteristic test circuit.main tasks as follows.Firstly,the test method of the existing power semiconductor devices is introduced.According to the characteristic parameters of IGCT,the technical indicators of the test circuit are determined.Combined with ABB and existing domestic IGCT related test equipment,the main structure of the test circuit is analyzed,and it is determined that the IGCT test bench includes two parts:high voltage power supply and test circuit.Secondly,the key issues of the high-voltage power supply module for testing are analyzed.Taking the voltage double rectifier circuit and the single-phase bridge rectifier circuit as the objects,through the establishment of mathematical and circuit simulation models,the inrush current problems in the voltage double rectifier circuit are analyzed,and several suppression strategies are simulated and verified.The power factor and harmonic problems in the single-phase bridge rectifier circuit are analyzed,and a specific harmonic elimination pulse width modulation strategy based on particle swarm optimization is proposed.And according to the advantages and disadvantages of the two circuits,the main structure of the high-voltage power supply for IGCT testing is determined.Thirdly,the main structure of the static and dynamic characteristic test circuit is designed according to the IGCT test principle,the corresponding device parameters in the circuit are calculated,and a blocking characteristic test bench with an output voltage of 0?8kV continuously adjustable is built.Based on the IGCT electrical simulation model(M-2T-3R-C)established by the research group,the dynamic characteristic test part of the circuit is simulated and validated by Cadence 16.6 software,and the influence of the stray inductance of each part in the test circuit on the dynamic characteristic test is analyzed.Finally,the control system circuit schematic diagram is designed in the Altium Designer15 software,and the host computer analysis software is also designed by labview2017,which realized the functions of real-time data communication,playback and calculation,and the relevant experiments of the dynamic characteristic test circuit is verified.