Reliability Analysis Technology For High-speed Wideband Optical Transceiver

With the rapid development of data communication and telecommunication technology,the capacity of the optical network has surged.As the core device of high-speed broadband optical communication system and network,the high-speed optical module has become a hot research topic in the field of optical communication.Higher speed,miniaturization,low power consumption,and intelligence,is the development trend of optical modules.High reliability is a basic requirement for optical modules to be used in practical communication systems and networks.The research on reliability analysis and testing technology of high speed broadband optical module plays an important role in promoting the development level of domestic key photonic devices and improving their market competitiveness.In this paper,the reliability of semiconductor lasers and high-speed optical transceiver modules are studied as follows:Firstly,a reliability block diagram model is proposed for reliability analysis of 100 G optical module.The reliability parameters for the sub-assemblies of optical transceivers are obtained according to the Reliability Data handbook and related literatures.Based on these,reliability parameters of optical modules are estimated,with the effect of the component reliability on the overall reliability of the optical module analyzed.Then,influence of temperature on performance of semiconductor lasers and optical receivers are analyzed theoretically.The relation between the decrease of output optical power and the the increase of temperature,as well as the relation between the shift of center wavelength to longer wavelength and the increase of temperature,are given,with the results verified preliminarily by experiments.Meantime,influence of temperature on SNR and BER of an optical receiver is also analyzed theoretically.The accelerated life test method of semiconductor laser and optical transceiver module is studied,with test circuits designed,and accelerated life test systems built.A comprehensive thermal-electrical stepping stress accelerated life test scheme was designed and carried out for for a group of lasers,with the degradation of their working performance with relation to thermal stress(temperature)and electric stress(working current)studied.And the corresponding accelerated life model and the life estimation results were given.The accelerated life test scheme show to have higher test efficiency than traditional single-stress accelerated life test methods.Finally,three different kinds of stresses were applied to some optical transceiver modules,and their performance degradation is studied by contrast accelerated life test.The above research results can provide reference for the research and practice of reliability growth and reliability test of optical module.