Research And Development Of Shared Cloud Platform For IC Design And Test

Traditional IC design and test are limited by the locations and computing capabilities of EDA servers and testing devices.Remote IC design and test based on the dynamic and scalable cloud computing can save computing resources when developing small designs or provide enough computing resources to support large-scale IC design and dynamic simulation.In addition,this shared cloud platform of IC development can also provide an integrated development and operation environment for various applications,and realize IC design,test and related auxiliary functions.Based on the research of cloud computing,IC design,development and test,this thesis analyzes the breakthrough point to promote the development of IC design and test.Cloud computing services are studied and a hierarchical cloud computing platform architecture was proposed.This thesis also respectively studies applications' API,IC design and test process.Methods of circuit design,algorithm development and chip test based on cloud platform are then proposed,and the corresponding applications are developed and implemented on this cloud platform.Compared with the traditional mode,IC design and test based on cloud platform are more flexible and have more powerful computing capability.Users can easily design IC and test chips on personal computers with finite computing capability.The cloud severs can also automatically expand computing capability with the increase of task complexity.This paltform provides a new model of IC development.With the growth of remote IC design and test based on cloud computing,this new model will effectively reduce the costs of chip development and test.In addition,this thesis improves the application algorithm for image processing ASIC.And compared with the traditional method,the proposed special test vector generation method is more accurate and faster.