Research On Single Event Upset Detection And Repair Technology Of Configuration Memory Of Zynq

Xilinx Zynq-7000 All Progarmmable So C provides performance and power of ASIC(Application Specific Integrated Circuit)and ASSP(App lication Specific Standard Part),and flexibility and scalability of FPGA,which is suitable for the high performance and low cost application of small satellites,micro satellites and pina satellites.Similar to SRAM FPGA,the SRAM memory cells of PL of Zynq-7000 are susceptible to space radiation,and prone to SEU(Single Event Upset).The SEU in configuration memory may directly change the function of circuits,and may have a permanent impact on the circuits,if not take measures to repair.In order to improve the reliability of Zynq-7000 in space radiation environment and promote the application of non-aerospace devices in small satellites,the research on SEU detection technology and SEU repair technology is carried out.Firstly,on the basis of analyzing the configuration memory and implement details of Xilinx SRAM FPGA,the research on SEU detection technology based on readback and comparison is carried out.In order to solve the long detection period and low efficiency of the SEU detection method based on global readback and comparison,a SEU detection method based on selective readback and comparison is proposed in this paper.The filtering of essential bit and essential frame is realized,and the selective readback for essential frame is realized.The SEU detection based on the selective readback and comparison is realized by comparing with the original configuration file.Secondly,on the basis of the research on SEU detection technology based on readback and comparison,the research on SEU repair technology based on dynamic scrubbing is carried out.In order to solve incomprehension of the SEU repair method based on modular scrubbing and long period of the SEU repair method based on readback and scrubbing,a SEU repair method based on modular scrubbing and readback scrubbing is proposed in this paper.The module-based scrubbing and frame-based scrubbing for the specified module and configuration frame is realized,and the SEU repair of based on modular scrubbing and readback scrubbing is realized with the combination of the SEU detection.Finally,taking some typical circuits such as FFT as examples,the validity of the SEU dection method and repair method proposed in this paper is verified by fault injection bit by bit,and these methods are evaluated by MTTD(Mean Time to Detection)and MTTR(Mean Time to Repair).Compared with the SEU detection method based on global readback and comparison,the proposed SEU detection method can greatly shorten MTTD.Compared with two kinds of SEU repair method based on readback and scrubbing,the proposed SEU repair method can greatly shorten MTTF.