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Development Software For WD-ED Combined X-ray Fluorescence Spectrometer And Study Of Correction Method For Mineralogical Effects In XRF

Posted on:2019-05-20Degree:MasterType:Thesis
Country:ChinaCandidate:X M SheFull Text:PDF
GTID:2371330569980453Subject:Materials science
Abstract/Summary:PDF Full Text Request
X-ray fluorescence spectrometry?XRF?is a widely used elemental analysis method.X-ray fluorescence spectrometer can directly analyze solid,powder and liquid samples,with simple sample preparation,high test efficiency and non-destructive analysis.However,in the research and development of high-power X-ray fluorescence spectrometer and its supporting control software,China has always lagged behind the international major manufacturers of scientific instruments;and mineralogical effect can not be corrected with general methods.Therefore,research and development of domestically-made XRF spectrometers with independent intellectual property rights and higher accuracy are of positive significance for promoting the development of domestic XRF spectrometers.This paper has developed programs for instrument control and data acquisition,which had been used in the domestic XRF spectrometers.The correction of mineral effects has also been discussed.?1?WED-XRF software was designed and completed with C#and.Net Framework platform,including the structure of program and the flows of measurement and operation.The program realized the real-time control of the WED X-ray fluorescence spectrometer,and it can collect data from wavelength dispersion system and energy dispersion system simultaneously.?2?A dual-threaded structure is designed for data transmission and reception in mechanical system,and then computers can communicate with all of the subsystems at the same time;A standard sample database is also established,which can be used for selection of standard samples.The spectrometer performance better with those features.?3?A new method with selection of calibration samples using K?/K?for the quantitative analysis was proposed.The K?/K?values of some major elements in geological standards were measured using wavelength-dispersive X-ray fluorescence spectrometry with RSDs under 1%.Four major compounds,Al2O3,SiO2,CaO,Fe2O3,in geological standards was measured,it is observed that the K?/K?values of the elements in different samples are significantly different,the maximum deviation of K?/K?value for Al reaches 20%.?4?According to K?/K?values,similar standard samples were selected,and the results of similar standards and non-similar standards were compared.It was found that the closeness of the K?/K?values between the standard samples and the tested samples had important influence on the accuracy of the quantitative analysis results.A comparison was made between a conventional multi-standard calibration method and a single-standard calibration method using K?/K?selecting standards.Results showed that the new method has lower errors,for Al2O3,SiO2 and Fe2O3,the average errors are reduced by more than 30%.Experiments with actual samples using new method showed that mineral effect is corrected effectively,total errors of measurements for the four compounds are reduced by more than 40%.
Keywords/Search Tags:XRF, software development, mineralogical effects
PDF Full Text Request
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