Research On Electrical Properties Of Nerve Cells Based On Atomic Force Nano-imaging

Nanotechnology,information technology and life science are the three most promising fields in this century.They are also closely related to each other.Just like atomic force microscope(AFM),as a basic research tool in nanotechnology,which is also popular in life science field.As one of the representative tools in exploring macromolecules or cell secrets by nanotechnology,it can be used to explore morphological and other various properties of cells,and study the manipulation of cells,DNA and molecules.Many nervous system diseases pose serious threats to human beings,and the research on physical or biological properties of nerve cells is of great significance for the understanding and treatment of nervous system diseases.The high precision and easy to use are of great advantages of atomic force microscopes in this field.In this paper,based on the detailed introduction and study of atomic force microscopes,a conductive atomic force indentation method was proposed.The purpose was to perform atomic force indentation experiments on the cells with electrical excitability such as living nerve cells.The mechanical curves of the probe and the cell obtained could determine the contact situation between them,and then the cell membrane potential changes were acquired while the nano probe tip penetrated into the cell membrane.The method was based on the probe-cell mechanics model and the probe-cell equivalent circuit model.Thus,the cell electrical signal acquisition module in the liquid was designed,which filled in the gap in the study of the electrical properties of living cells by atomic force microscope.Based on the above work and system design,a preliminary study on the relationship between the self-repair behavior and repair time of nerve cell membrane was carried out.