Research And Design Of A Test System Of Smart Card Based On ZYNQ

The smart card is a card with an embedded microchip.With the development of the internet of things and the integrated circuit industry,smart cards are becoming more and more widely used in all aspects of production and life.The promotion and application of NFC will be a trend of the scientific development in the next few years.In the field of smart cards,the adaptation between the card reader and smart cards is increasingly becoming the bottleneck of promotion and maturity for smart cards.Due to different manufacturers?process levels?technical standards,smart cards already on the market can't be fully compatible and matching with smart card reader.The ability to fault detection of the hardware and software components will be of great importance either for contact or contactless smart card instrument.The traditional test methods adopt discrete MCU chip and dedicated chip to support the application of protocol layer and physical layer,respectively.The parameters are already solidified but the expansion of system and transmission rate are defective.This thesis designs and implements an emulating test system of smart card with a high degree of flexibility both for contact and contactless(that is NFC technique)smart cards.The carrier frequency,the modulation depth and other technical indicators can be controlled in a certain range,and the test system is compatible with different application layer protocols,to make the test customizable and reusable.The main research work and innovations are listed as followings:1.According to the ISO/IEC7816 protocol,the simulation system of smart card is implemented for the contact smart card,which can communicate with the smart card reader.The system can realize detection of specified content command and the checkout of fault-tolerant function.2.According to the ISO/IEC14443 protocol,the system of smart card reader is simulated for the contactless smart card,which can communicate with the NFC devices under the condition of different working frequency,modulation depth and other technical indicators.This system can detect the suitability of the NFC devices under different parameters.3.The hardware platform for smart card simulating test system is ARM+FPGA ZYNQ-7000 SOC.The design takes a full advantage of the devices and also applies AXI chip bus with high performance and low latency as well as the DMA transmission.Compared with the traditional method,the solution based on ZYNQ-7000 SOC can achieve new function only by modifying the code without changing the hardware circuit..The reconfigurable feature of software and hardware can ensure that the system meets the testing requirements of new smart card in the future.