Development Of A Testing Device About R_s Distribution In High Temperature Superconducting Thin Film

Rapid development in the measurement field today, specific parameters of the test circuit also constantly arises at the historic moment, and the test circuit integration in constantly increased, the traditional dedicated devices are increasingly unable to meet the modular, portable and body product market demand. In order to improve the flexibility of test and scalability, test circuit also constantly toward the rapid test, operation simple and measurement results readable in the direction of development, these test circuits more and more by the market welcome.This paper according to a broadband frequency divider chip to design a test circuit, not only the operation is simple and clear, readable test results and design the similar to the dichotomy, but also greatly improve the speed of chip test.Firstly the basic theory of the devices involved in the test circuit are described, and then analyzes the performance of test is the broadband frequency divider chip, and then develop a test indicators, and according to the design of the test index amplitude frequency test circuit. In this paper, based on the design of the circuit for the selection of the chip, and broadband, active low pass filter, voltage comparator, differential circuit, voltage adder and other key components of the design and simulation. Finally, using the appropriate network analyzer, spectrum analyzer, function generator, oscilloscope and other devices to test the device, and then the whole test circuit to carry out the joint debugging and testing, and make it meet the requirements.The test circuit for the completion of the lack of and some improvements, using AT89C52 single chip of the test circuit for the information processing, and the use of serial information and transmitted to the computer, finally shown on the interface program has been compiled. The final test results show that the test circuit shows that the power and frequency of the test chip can be accurately tested, the power error is ± 1dB, the frequency error is ± 1Hz.