Research On Reliability Evaluation Technique Of Plastic Encapsulated Ics

The plastic encapsulated microelectronics (PEM) are widely used in the highreliability field of aerospace and aviation, most of the PEM are imported from theforeign countries. The designers have to use the PEM when the alternative hermeticencapsulated microelectronics does not existed in the market.The materials and structure of the PEM has its inherent character, the uniquefailure mode and mechanism are existed in the PEM. The usage of the PEM in the highreliability field of aerospace and aviation should be evaluated to ensure the usage basedon the analysis of the failure mode and mechanism, and the reliability evaluationtechnique is required.First, the failure mode and mechanism of the PEM and the abroad applied methodsof quality control of the PEM are researched. The reliability acceleration model isdeeply analyzed and the significance of the abroad research results is described. The testitem, test stress, test flow of the reliability evaluation technique are analyzed and itbecome the theoretical base of the overall technical scheme.Second, the overall technical scheme is designed and it is based on the analysis offailure mode and mechanism and the reliability acceleration model. The criteria of testcomponent selection are determined and the targeted test items are selected.Third, the PEM are put into the grouped test based on the overall technical scheme,and the test results are analyzed. It includes the stability analysis of electronic characterand structural character, the grouped test result are evaluated. The failed PEM aredeeply analyzed, and the failure mode and mechanism is verified, the effectiveness ofthe evaluation technique is verified.Finally, the synthesized analysis of the research is introduced and the researchresult is described. It is pointed out that the reliability evaluation technique is animportant method to improve the using reliability of the PEM. With the projectrequirement and development, the future research field is pointed out and the outlook ofthe development of reliability evaluation technique is described.