Noise Control For The Main Control System Of Scanning Electron Microscopy

The scanning electron microscope is a precision observational instruments, has been widely used to observe the material’s surface morphology and study the microstructure and composition of the material, playing a huge role in the life sciences, materials science, chemistry, physics and other research areas. With the development of electron microscopy, scanning electron microscope has become an indispensable tool of high-tech research and routine analytical testing for research organizations and business units.Compared with the optical microscope and transmission microscopy, scanning electron microscopes have advantages:high resolution, depth of field, image rich stereoscopic effect and so on. In practical work, scanning electron microscopy will be a variety of noise interference, affecting the image quality, thereby affecting the correctness and accuracy of observation. The main control system is the core part of scanning electron microscopy, which is used to detect system status and control parameter settings and load, generate a scanning signal, control the lens and tube deflection, collect the detection signal and sent to the image display system, communicate with the host computer and other functions. Thus, noise analysis and control of the main control system for scanning electron microscopy will help improve the performance of electron microscopy observations.This issue is to start from the working mechanism of the scanning electron microscope, and then noise analyze of the main control system and its impact on image quality, specifically the scanning circuit, the photoelectric conversion systems and video signal acquisition system.The power system of control panel is divided into two parts to improve its noise immunity. On the same time, the subject illustrates how to design and debug the hardware circuit. The test results show that the quality of electron microscopy imaging is good and noise has been effectively controlled.