The Design And Implementation Of Batch Testing System Of Integrated Circuit Wafer

The development of semiconductor industry in the recent decade has brought manynew business models. The IDM (Integrated Design and Manufacture) companies becomedisappearing, while the number of Fabless (non production line) chip design companiessharply increases. As these fabless companies need to test foundry wafers, it is necessary tocreate a complete set of testing architecture. This thesis is mainly based on wafer batchtesting platform of testing workshop in Shanghai HuaHong Integrated Circuit Co., Ltd, anddiscusses design and implementation of a wafer batch testing system for Fabless chip designcompanies.This thesis studies and analyzes wafer testing in Fabless chip design companies, andfurther identifies the requirements of general testing on varied types of products as well asmanufacturing management and control. As such, the thesis presents a script configurationtesting process, server coordination management solution. The whole solution adopts C/Sarchitecture, which uses an underlying SQL Server and also MFC-based front-end interface.For the purpose of testing varied types of chip products, the basis TCL scripting language isexpanded to implement different types of chip testing process with the manner of scripts.For the purpose of manufacturing process control, the intelligent process card managementmethod is introduced, which utilizes intelligent processes cards to cooperate with thecontrol server in order to complete the management of production processes. For schedulingof product serial numbers, the system adopts uniform management method that relies on“server allocation and client consumption”. The probe station adopts a message-drivenmanner to achieve the complete process of testing actions. Also, the thesis discusses indetail statistics of testing data, and even presents their different specific implementation. The value of this study is to meet the demand of Fabless chip design companies forbatch testing wafers after fabout from foundry. It greatly improves the efficiency of batchtesting. At the same time, my study strengthens the control of manufacturing management.The entire system is able to automatically operate, besides a little bit of manualinterventions. Thus it achieves a high degree of automation. The system has now been putinto use, meet previously stated design requirements, and achieves well applications.