Research Of Memristor Testing Methods And Flip-flop Circuit Application

The memristor is the fourth basic component besides the resistor, capacitor andinductor. Memristor is a nonlinear resistor with memory function, and its resistancedepends on the number of the charge that flow through it. The physical realization of thememristor has shocked the world. Memristor has the characteristics of nonlinear resistivechange, high speed, low power consumption, high integration density and compatibility ofstorage and computing. The research of memristor testing methods and flip-flop circuitapplication has a great significance in the fields of information storage and logiccomputing.This paper is focus on the characterization and testing of the memristor from the directcurrent, alternating current and pulse operation. A testing system that include normal andhigh speed testing is developed, and the related control program is also designed. Thesystem is designed considering the signal integrity problem in high speed testing andguarantees the reliable transmission of high frequency signal. A series of testing resultsprove the feasibility and reliability of testing methods and testing system. The fastresistive-change phenomenon in AgInSbTe memristor is also achieved.In this paper, a memristor SPICE model based on the boundary migration theory isalso built and the memristive characteristic is analyzed by simulation. A memristor-basednonvolatile flip-flop circuit is designed and functionally verified by SPICE simulation.The researches above have great value to the application of memristor in informationstorage and logic computing fields.