The Research On Total Dose Effect Of DSP

With more and more extensive application of DSP in the spacecraft and satellitesystem, the radiation effects of DSP on space application needs high attention.Meanwhile, the research on DSP total dose effect and its test method is also significant.Up to now, there is no standard on DSP total ionizing dose effect’s test method andirradiation bias mode in the domestic and overseas, which dues to the complication ofDSP. In order to put forward a reasonable test method that can mainly focus on DSPtotal ionizing dose, this paper views TMS320C6701as the research object, and it isbased on the fundamental structure and operating principle of TMS320C6701. Firstly,establish total ionizing dose sensitive parameters and the worst bias on unit circuit ofCMOS through a detailed study on the total dose effect of the MOS. Secondly, give atotal ionizing dose effect analysis on DSP’s I/O circuit and its core circuit in the form ofspecific circuit. Then, make a total dose effect testing program which combines staticbias and dynamic bias on DSP. Meanwhile, the detailed experimental process should bepresented which can provide the significant theoretical basis for design of testingsystem for DSP total dose effect, thus directing the whole total ionizing dose test.