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Highlight Repair And Inhibition Method For High Reflection Surface In Coded Structured Light Measurement

Posted on:2014-09-29Degree:MasterType:Thesis
Country:ChinaCandidate:X Y WangFull Text:PDF
GTID:2268330428960916Subject:Measuring and Testing Technology and Instruments
Abstract/Summary:PDF Full Text Request
High reflection surface of the object will have some information missing, whichhas a great influence in subsequent image processing algorithm. Therefore, aiming athigh reflecting surface highlight part removal and recovery of missing informationput forward a variety of solutions.This paper around the high light reflecting surface coded structured lightmeasurement, aiming at the problem that reflecting surface coded structured lightmeasurement there is highlight which is difficult to remove and image details arelosing is studied. The main research contents are as follows:1.Comparate and analyse methods of single image highlight remove, that areimage complementary method, dichromatic reflection method and color spaceconversion method. According to color space conversion method loss the imagedetails in highlight reflection, design a single image highlight inhibiton method:singular value decomposition. Experiments for color space transformation methodand singular value decomposition method, and then give out results.2. Comparate and analyse methods of multiple images high reflection areasinhibition, that are multi-angle measurement method and exposure time adjustmentmethod. According to characteristics of coded structured light system, selectexposure time adjustment method, experiment and give out results.3. Under coded stuctured light system, use singular value decomposition methodand exposure time adjustment method for high reflection image binarization andedge detection experiments, which applied to the later experiments.
Keywords/Search Tags:high reflection surface, coded structured light measurement, highlightsinhibition, specular reflection
PDF Full Text Request
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