Research On Highlight Separation And Repair Technology Of Three-Dimensional Structured Light Measurement

With the rapid development of modern industry,optical 3D measurement has been widely used in computer vision,automatic detection,reverse engineering and other fields.As an important branch of non-contact optical 3D measurement technology,structured light 3D measurement technology has wide application prospects due to its advantages of non-contact,simple principle,time saving and low cost.However,when the surface of the measured object is relatively smooth or the light source is too strong,highlights are generated on the measured surface due to the specular reflection phenomenon,which distorts the image information collected by the traditional structured light 3D measurement method,makes it difficult to carry out efficient and accurate three-dimensional morphology reconstruction,and is one of the key points and difficulties that restrict the development of structured light three-dimensional measurement technology.In view of the above problems,this paper studies the highlights separation and repair technology of three-dimensional structured light measurement.The main research contents are as follows:(1)On the basis of reviewing the current situation in the field of three-dimensional structured light measurement,the principle of structured light measurement is introduced in detail,four-step phase shift method being used to obtain the phase,multi-frequency heterodyne method being used to expand the phase,the calibration method of the binocular structured light measurement system being described,and the stereo matching being realized based on the epipolar constraint method.(2)A highlight separation and repair method combining hardware and software is proposed.Based on the dichromatic reflection model,independent component analysis algorithm and chromaticity separation algorithm are developed to obtain highlight areas and highlight components,and then adaptive fringe-pattern projection technology is combined to achieve three-dimensional measurement;further for the situation where the specular reflection phenomenon is strong and the highlight separation result is not ideal,the "information hole"area is processed by combining pixel filling technology to achieve highlight repair.(3)The three-dimensional measurement experiment system is introduced,the separation effect of the independent component analysis algorithm and the chromaticity separation algorithm is verified through experiments,and conduct a comparative analysis with the traditional highlight separation method.On this basis,the highlight separation and repair methods proposed in this paper are used to carry out multiple sets of sample measurement experiments to systematically verify the measurement accuracy and measurement efficiency.Through the research in this paper,a measurement method combining chromaticity separation algorithm,adaptive fringe-pattern projection technology and pixel filling technology is proposed,which effectively achieves the highlight separation and repair in structured light measurement,improves the measurement accuracy,and enriches the structured light three-dimensional measurement method,and is conducive to promoting the development and progress of related 3D measurement technology.