Improvement And Study Of The Antireflection Film Process For The PID Cells

Over the past decade, solar energy has become more and moreimportant in the world, and the PV systems have become lager consistingof an increasing number of solar modules being interconnected. Power lossand degradation have been observed in PV modules resulting from thestress exerted by system voltage bias, especially High Voltage Stress. Thisis due in part to qualification tests and standards that do not adequatelyevaluate for the durability of modules to the long-term effects of highvoltage bias experienced in fielded arrays.In this paper, the current condition and the roadmap are described,which include radical principle of silicon cells and the analysis of elementsthat influence the cells’ efficiency. At the same time, testing methods andstress levels are described that demonstrate module durability to systemvoltage potential induced degradation (PID) mechanisms. After theanalysis for the elements of PID and cells’ efficiency, the improvement ofSiNxfilms will be discussed in this paper, which can avoid the PID effect,reduced the power loss and degradation of modules and PV systemswithout changing the process and materials of modules.