Design And Implementation Of Arbitrary Waveform Generator For Analog IC Tester

Analog IC automatic tester is commonly used in integrated circuit testinginstrument. It is an essential tool in the integrated circuit tester system. As an importantpart of the the tester system, the arbitrary waveform generator’s parameters performancehave a direct impact. Overall, the current domestic and foreign have manymanufacturers to supply the arbitrary waveform generator. If the arbitrary waveformgenerator module directly use the products of other companies, it will reduce the entireproject development cycle, but it will also greatly increase the cost of the project.Taking into account that the project itself is a low-cost analog IC tester, at the same time,the tester system uses an open architecture which has so strictly requirements on thevarious functional board interface that the other company’s products is not easy tointegrate. Based on the above two points, developed our own arbitrary waveformgenerator module is particularly important. In addition, the module uses two modes inthe concrete realization, which are the ARB Mode and the DDS Mode.The first chapter introduces the development status of the integrated circuitautomated testing related industries and the arbitrary waveform generator for analog ICtesting. The second chapter describes the hardware and software system architecture ofthe analog IC tester. The third chapter describes the arbitrary waveform generatorhardware system, which mainly include the FPGA, SDRAM, waveform generationDAC, filter circuit, differential to single-ended circuit, the magnitude of the fine-tuningcircuit, the amplitude coarse circuit, the amplitude offset circuit, the output impedanceselection circuit, the sync output circuit, trigger source interface circuits, signalconditioning circuits, the SRAM memory board, the DDS board, the relay driver circuit,and the power supply part. The fourth chapter describes the software system of arbitrarywaveform generator. The end of the chapter describes the system test result, the specificproblems encountered in debugging and the corresponding solutions.