Temperature Control Circuit Measurement System Based On FPGA

The temperature controlling circuit is a hybrid integrated circuit that composed of digital integrated circuit and analog hybrid integrated circuit. The circuit is mainly used for measuring work temperature of internal electronic components within a special device. Within the specific temperature (-60℃～+150℃), the temperature controlling circuit measurement system tests whether temperature test of the temperature control circuit (hybrid integrated circuit) fulfills the standard of the electrical properties.At present, in the widely used measuring system, MCU, as a most adopted processor, has the weak points like poor anti-jamming, slow speed of the acquisition and processing of the high speed data which seriously affect the stability and real-time of the measuring system. Aiming to effectively solve the problems of MCU in the measuring system, a new system is offered in this paper, which selects FPGA as based processor, Nios Ⅱ as a system control unit, by self-defined the FPGA functional modules and SOPC system and supported by appropriate soft/hardware resources to achieve an effective solution to the problems that exist in this type of measurement system based on single chip.After a simple introduction of the temperature control circuit, the needed performance index and the technology requirement of measuring system in this circuit are proposed in this paper. Reading these indexes and requirements for reference and engineering the hardware and software of the measuring syste,a detailed measuring scheme that constructs a reliable temperature control circuit measurement system is designed in the paper.. The design and implementation power supply of this product and voltage/current monitoring circuit, the time reference pulse signal generating circuit, signal isolation circuit, temperature reference circuit. At the same time, it is possible to function module programming with the hep of Verilog HDL as well as realize the whole controlling programming with C language. Below the premise that assures reliability, it enables the system to measure the working performance of the temperature controlling circuit. Meanwhile, using the system of Nios Ⅱ technology development makes the circuit structure of peripheral hardware become more stable and reliable, and customized application would be realized.Through the debugging and trial of the "temperature control circuit measurement system", the system runs steadily and realizes all the expected functions. Practical application shows that the system can satisfy the performance index of the temperature controlling circuit. which will have positive effects on product quality.