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Multi-Line State Test System In Measurement&Control Network Based On FPGA

Posted on:2013-01-09Degree:MasterType:Thesis
Country:ChinaCandidate:S J LiuFull Text:PDF
GTID:2248330392452049Subject:Electronics and Communications Engineering
Abstract/Summary:PDF Full Text Request
Measurement and control network is mainly composed of measuringdevices, measuring stations, data center, C2network (command and controlnetwork). This network is the basis of precise measurement and control. Itrequires high reliability. Now, telephone lines between the measuring devicesand the measuring station, fibers between the measuring station and datacenter constitutes a hybrid-type transmission mode of the data. In order tojudge the reliability of data transmission in the entire line, checking the linerequires using of the BER tester and level detection equipment. But, the realtime performance of the instrument detection makes a lot of inconvenience inthe detection and management of multiple data lines. How to use existingtechnology to design and develop integrated circuit test system suited for bothbit error detection and level characteristics have important practicalsignificance.Multi-line state test system is composed of hardware and softwaretechnology to achieve. Part of hardware firstly analyzes the principles of theMODEM, the digital data network and the FPGA in the test, secondly designsvarious types of circuit based on the interface or access specification, oncemore integrates into the FPGA as the control unit of error plate and electricalplates, and finally completes FPGA hardware control program. Thecommunication between hardware and software specifications, convenientoperation between man and machine in a modular manner based on SoftwareVC++6.0platforms were developed. System tested by users can meet lineerror test for69lines and real-time level monitoring of24lines. The testresults can be transmitted to the user whose line is protected in real time. Thismethod greatly improves the detection efficiency of the line.Multi-line state test system have been received better results in the actual operation of the process, the effect of the test system detects have been metthe design requirements. Now, the test operation of the system is running inthe local network of monitoring and control system. After inspection by theuser, the system can be widely applied.
Keywords/Search Tags:FPGA, Multi-Channel, Bit Error Ratio, MODEM, COM
PDF Full Text Request
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