High Precision Measurement Based On Arm11 Grating Signal Acquisition System Is Designed

Metrology is of great importance to manufacturing industry and scientific research of a nation. In recent years, technologies in computer science, automation, information processing and sensors have been widely used in measurement field, which brings both development and stricter requirements of metrical instruments. Metrical instruments are becoming high-precision, digital and miniature, which attributes to the emergence of embedded systems and realization of large-scale integrated circuits. The accuracy of the precision Metrical instruments is in submicron or even higher. Nations all around the world invest heavily in the development of length measurement techniques. Grating measurement system has been widely used in the field of numerical control machine, aerospace, precision machinery, mechatronics, machinery automation, robotics and so on.In this dissertation, two kinds of design are accomplished:the signal acquisition system design of sensors’rear-end and the hardware circuit design of count module, subdivision module and direction module which are based on the grating measurement sensor and analysis of the measurement mechanism of Moire fringe. The development of the underlying driver and the upper human-computer interaction are accomplished on embedded Linux as well. Finally, the desired measurement accuracy requirements are achieved.There are four highlights in this thesis:using the ARM11chip for raster data acquisition which realizes real-time acquisition and processing; using LINUX embedded operating systems for data acquisition and processing which eliminates the use of an external computer to complete the processing of data; using touch screen which saves a lot of peripherals; using CPLD which brings simplification to the measurement system, stationary to the signals and higher precision to the measurement.