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P-type Transparent Conductive Film And The Diode

Posted on:2009-07-02Degree:MasterType:Thesis
Country:ChinaCandidate:Y H WangFull Text:PDF
GTID:2208360272459063Subject:Physical Electronics
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SrCu2O2,CuAlO2 and CuFeO2 ceramics were synthesized by solid state reaction and corresponding thin films were successfully fabricated by channel spark ablation, respectively.The electrical,optical properties and structure of these ceramics and films were characterized by four-probe method,Hall system,spectrophotometer, XRD,AFM etc.Also,a serie of CuA1S2:Zn films were deposited on glasses in the CSA apparatus for the first time and the relations between their physical properties and ablation parameters,such as argon partial pressure,substrate temperature and current were investigated in detail.Furthermore,using this novel p-type thin film transparent pn diode was prepared together with n-type IWO film.SrCu2O2,CuAlO2 and CuFeO2 ceramics and films all exhibite p-type conductivity.The resistivities of SrCu2O2,CuAlO2 and CuFeO2 films are 260Ω·cm, 110Ω·cm and 85Ω·cm,respectively.P-type CuAIO2 film has a better optical transmittance compared with the other two series.CuAl0.90Zn0.10S2 film,prevailing in conductivity,maintains the chalcopyrite structure which was indicated by XRD pattern.Its hole conduction was confirmed by positive Seebeck and Hall coefficients and its best electrical conductivity and carrier mobility could reach 65.3 S·cm-1 and 5.7 cm2V-1S-1.It is also obvious that argon partial pressure,substrate temperature and supply power of ablation,as well as annealing process could have remarkable effects on opto-electrical properties of CuAl0.90Zn0.10S2 films.The highest average visible transmittance of these films was above 70%.The pn-heterojunction diode formed by CuAl0.90Zn0.10S2 and IWO film exhibits rectifyingⅠ-Ⅴcharacteristics with a threshold voltage of 0.5V and its forward/reverse current ratio is larger than 80.The transparent device has an average visible transmittance of more than 50%.
Keywords/Search Tags:p-type transparent conducting film, CuAlS2:Zn, channel spark ablation, transparent diode, Hall effect
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