Millimeter Wave Target Detection Technology

Millimeter wave object detection makes use of the electromagnetic thermal emission of the subject and reflected thermal signals from the background, millimeter wave object detection, in comparison to visible or infrared object detection, has great potential advantage of detection through fog,cloud,smoke,sandstorms and other poor weather conditions. Current detection systems relied on mechanical scanning of a single beam across the scene has problems of low spatial resolution and poor sensitivity. During the past several years, due to significant advances in the development of solid state components and high speed signal-processing technology, multi-beam array imaging systems, which promise an increase in sensitivity and resolution have received considerable interest in both the military an civilian applications.In this article ,at first present the state of the millimeter wave object detection technology and discuss the common theories and principles of it, and chiefly analysis the principles,constitutes of the system,key technology of the millimeter wave focal plane array imaging system and the synthetic aperture imaging system.Then according to the theory of the millimeter object detection, build a 8mm band one-channel direct detection system, which is proposed on the background of the millimeter wave focal plane array imaging system. Make the experiment to demonstrate the correction of the principle of the millimeter wave object detection technology. At last this article describes the theory of the millimeter wave object detection system and provides a project of the system in detail. This 32-channels focal plane array imaging system operates in 8mm band. It can provide 90×15 degrees field of view, and displays the acquired image during 6 seconds in sunny and foggy. This article according to the acquirement of the system parameters such as: temperature sensitivity,angle resolution,image forming time etc to design the type and diameter of the antenna; The receiver type, integral time, RF gain, LPF gain; the mode of calibration; the sample frequency and program of the DAQ; the scanning time, scan type, etc.