Ccd Deflection Measurement System

Charge coupled devices (CCD) are sensors which integrate the optics to electronics conversion, charge storage and charge transition. The advantages of CCD in measurement are high accuracy, low cost, easy maintenance and simple manipulation etc. as it has such features as self-scanning, high aspect ratio, high sensitivity, compact structure and accurate pitch position. Therefore, it meets the needs of high efficiency, automation, on-line detection and non-contact detection, which make itself quite competitive in the measurement of small dimension.In this thesis, the techniques of distortion measurement by CCD are investigated. Variety of sensors have been applied to measure the distortions of trusses arising from the masses of steel trusses and loads, most of them require a good basement. However,it is difficult to find the basement in the case of measurements of huge trusses due to the movements of trusses and the limitation of measurement conditions.The difficulty may be overcomed by laser measurement system which employees a pair of CCD sensor and laser emitor. The on-line monitoring system of the truss distortions in the thesis are composed of laser device, CCD reception system and MCU, which connect to the upper PC with the interface of RS232/485 conversion. It could measure the distortions of trusses on-line in coarse conditions with TCD132D, a kind of linear matrix CCD of Toshiba, as the key parts of sensors, and with INTEL 8031 MCU as the control device. The monitoring system, the features of which is rapidness, accuracy, stability and reliability, and simple manipulation, may be used to continuous measurement in a long time. The tasks are implemented in this paper as follows:1) Based on the functions of the system, the modified strategy of distortion measurement is given and the principle of distortion measurement is analyzed. A special measurement system is constructed on the basis and is working continuous and overcomes the weakness of formal system.2) Choosing CCD, designing the driving circuit of CCD, MCU system and control program are given respectively. Furthermore, the errors of the whole measurement system are analyzed. Finally, the key elements of the system are verified by tests.