| From the 1960's. especially after the bom of Laser and optical fiber, the development of Polarization Optics speeded up. Now the applications of Polarization Optics Technology include photoelastimetric method, optic axis localization?consistency measurement of sugar solution. electro-optic modulation .. magneto-optic modulation * liquid crystal optics * optical communication?optical transduce?optical on-ofL optical modulation > optical storage. heterodjue measurement > thin film detection, mass structure detection?fluorescence measurement of organism cells ^ picture identification and the latest biologic chip detection. The Polarization Optics Technology has been very important and useful in many fields.With the rapid development of Polarization Technology, it's important to measure the polarization character of light beam and substance, and people hope the quality of polarization devices to be more and more perfect. So they develop and set up many methods and systems to measure Stokes parameter Polarization degree, Jones vector Jones matrix, Mueller matrices > Retardation of wave plate, etc.After browsed many theses and dissertations, we found the existing systems, generally, can measure only one polarization parameter, and can only measure the parameter of one dot (big or litter) on the sample, they lack of the function of uniformity measurement. In fact, for the defect of processing technic and the material itself and external disturbance, the polarization character in the whole transmission plane is inhomogeneous. To measure the uniformity, we can move the sample, but the process is too complicated and time consuming, and is not equal observations.For the sake of changing this situation, we set up a system called Two-dimensional Intelligent Multifunctional Measurement System for Polarization Parameters using CCD matrix. This is an optical-mechanical-electrical-computerized system. It can be used to measure Jones vector-Polarization degree and Stokes parameters of each dot area on the cross-section of light beam. It can also be used to measure Jones matrix. Mueller matrices, direction of fast axis and phase retardation of wave plate, transmissivity, dichroism and rotation angle of each dot area on the transmission plane of the sample. The most important advantage is that the polarization parameters of different areas on the sample(include cross-section of light beam) can be measured in the same time, we needn't move the sample or the measurement system. We programmed a software using Visual C--6.0 in Windows 2000 Professional (Simplified Chinese Edition) to control the measurement system. The software is intelligent, it can operate the system, handle data and export result a!' by itself. la this thesis, we describe the principle, establishment, software , error and improvement of this system, the measurement of retardation of wave plate is describe more detailed.In Chapter One. we explain the great significance of two-dimensional measurement of polarization parameters; generalize the methods of polarization parameters measurement in the world, especial!; list some standard methods of retardation measurement, compare and analyze their advantages and disadvantages briefly.In Chapter Two. we analyze some representative measurement methods of polarization parameters include one method to measure Stokes parameters. Polarization degree, Jones vector, Jones matrix, Mueller matrices and six methods to measure the parameters of wave plate(retardation and position angle). The six methods are Jones matrix calculation method, Mueller matrices calculation method ^ extremum method and four-time phase-shift method, two detectors normalizing method, Senamont method, Tardy Method. We analyze the principles, error sources and characteristics of all this methods.In Chapter Three, we design a Multifunctional Measurement System for Polarization Parameters of single dot area, it can be used to measure Stokes parameters. Polarization degree, Jones vector, Jones matrix, Mueller matrices and the para... |
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