Study On The Method Of Improving Spectral Resolution Of Electron Microscope

With the rapid development of materials science, nano-material applications become more widespread in the field of materials. Because nanomaterials have outstanding surface effect, small size effect and quantum confinement effect, which is different from ordinary materials nano-materials with optical, electrical, magnetic, thermal, mechanical, mechanical and other properties, can improve the strength of the material, hardness, changes Material color, enhanced magnetic materials and so on. So nanomaterials in mechanical, magnetic, electrical, thermal, optical and life sciences have a wide range of applications, showing the great superiority. Therefore, the analysis of nano-materials analysis gradually become a hot field. Electron microscopy techniques for nanomaterials micro analysis to characterize the structure and components are now using scanning electron microscopy-energy dispersive spectroscopy (SEM-EDS) associated with the technology as a major test methods. The morphology of structural characterization of nanomaterials, the resolution of today’s electron microscope can achieve nanometer level requirements, but its composition analysis, since the characteristic X-ray energy is high, so today’s resolution spectroscopy technique generally only can reach 130eV, for the. analysis of nanomaterials in the spatial resolution and energy resolution limitations exist, which would be such as qualitative and quantitative analysis, elemental analysis of the distribution of such traditional methods resulting bias. Conventional spectrum analysis methods are inevitably subject to interference from the sample is superimposed and a base material of the characteristic X-rays of characteristic X-rays, which ultimately affect the results.To overcome the problem of insufficient resolution spectroscopy, this paper uses a perforated carbide coated carbon This means a good mix dispersed nanoparticles attached on their carbon, energy spectrum analysis. By contrast nanomaterials in silicon carbide and the general spectrum of the experiment, added punch carbide coated carbon nano hybrid materials for spectrum analysis of a great help, its spatial resolution and energy resolution than previous conventional Experiments have been greatly improved. The advantage of this approach is that thin nano-carbon, greatly reduces the action range of electron beam inside the sample, reduced element characteristic X-rays emitted by volume.While the carbon holes sequesters electron beam, reducing the characteristic X-ray interference base; addition, the sample is a single layer of nanoparticles dispersed, interfering elements are not superimposed, so that the resolution is improved.