| Most digital automated test equipment (ATE) systems generate and/or acquire patterns of 1's and 0's to communicate with a device under test. With recent innovations in digital components, however, these systems require a more sophisticated digital tester with capabilities beyond a simple logic analyzer with two on/off states. Faster chip speeds and the industry trend toward serial versus parallel digital protocols are necessitating ever higher sampling rates. In addition, the emergence of different voltage levels such as single-ended signals and differential signals spring from new series of logic devices development which require more and more complex meaurement towards the development. This Pattern I/O modules could meet high-precision measurement, single-ended signals, differential signals whicn is required to make up for the inadequate of test equipment.Pattern I/O module is developed based on PXI bus which is built in high-end timing and trigger bus. Test and measurement solutions with types of I/O modulars and corresponding software could build in userdefined way.Software structure of PXI-based Pattern I/O module is discussed in this thesis. Selecting driver routines is principal job of WDM model driver which responsible for IRP packet processing and transferring. Then developing instrument-mode driver which encapsulation functions according to communication protocols and work processes, and provide dynamic link library(dll). Finally develop the man-machine interface by LabView CVI., that modules could use this interface for self-testing.This Pattern I/O can achieve high-speed multi-channel digital signal input and output, with complex synchronized relationship; receive and transmit graphic data from the device and compare with expected data that testify this equipment is in normal operation. Test system build up with this module is reliable and precise in testing, and can be widely used for online diagnosis, bus simulation, microprocessor simulation and electronic equipment. |
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