This paper provides a basic method to realize the conversion function of A/D with NCS (Numerical Control System) just like three dimensions CMM (coordinate measuring machines), and in order to measure complex curved surfaces with Numerical Control equipments, then make use of the converse engineering technique to construct the mathematic model of the measuring surfaces. This text also studies and analyzes touch trigger probe systems which fit the machining center measuring, and introduces all kinds of probe, and analyzes construction, function and characteristics of touch trigger probe systems. For example, this text is deep into analyzes one RENISHAW probe-MP12 which applicable to the EUMA MV-610 machining center with SIEMENS 840 DE NC system; and study the conjunctions and communication between probe MP12 and machining center theoretically; and calculate the main error margin of the MP12 system. This text has purpose to realize the research, and extensive application of this method in actual currently.Firstly, the paper introduces the research background and research effects, the important function of machine manufacturing industry and its development in the process of technology. Immediately, the paper analyzed the development trend and request of the manufacturing technique, and provides the task to realize measuring function on machining center, and introduced the research and application of the related technique development. This text put great emphasis on the introduction of the construction and functions of various probes. According to the characteristics of machining center EUMA MV-610, we used suitable probe system type, and studied the theories of conjunction and communication between probe system and machining center. Secondly, this text studies related technique of measuring complex curved surfaces on machining center, then analyzed various factors of tolerance, and calculate the main working errors of the probe carefully.Finally it concludes the content of the text, and provides next research direction. |