Research On The Noise Evaluation Technique For Radiation Tolerance In Silicon Materials

Silicon material is the most important of today's microelectronics and photovoltaic materials, the silicon solar cell is applied satellites and space equipment's continued, clean and the most important power supply. Thus, by studying the radiation hardness of silicon materials to improve device performance under the radiation environment is even more meaningful.Noise is closely related to the defects in materials and electronic devices, and the characterization parameter are rich, can provide a sensitive, non-destructive, universal, complete, high reliability evaluation techniques for silicon materials and silicon-based devices radiation hardness study. Researching the noise evaluation technique for radiation tolerance in silicon materials, base on the existing common silicon technology and applications, the main work is :Design some test structure and purchase common Si-unijunction transistor and Si-solar cells, carry out a purpose-designed 60Coγ-ray irradiation experiments. Testing and comparative analyzing the electrical and noise characteristics of samples before and after irradiation, to make the research findings have more practical significance. In this paper, basing on the studies of silicon material and Si-solar cells performance degradation mechanism of radiation damage, noise detection theory, and the experimental results , an optimal choice for noise assessment parameters of the silicon material and Si-solar cells'radiation properties is presented.At the same time, study the noise evaluation theory for radiation tolerance in silicon materials and Si-solar cells, and propose silicon and Si-solar cells noise non-destructive evaluation techniques for radiation tolerance, including parameter extraction, evaluation criteria and processes. And draw a Si-devices the ability of anti-radiation screening programs by applicating the silicon material and Si-solar cells noise evaluation techniques.