| Emissivity is an important parameter in the infrared radiation characteristics of objects, which is of great significance in many measuring and research field. This paper has proposed a new method for measuring surface emissivity of object, deduced the measuring formula of emissivity, analyzed the factors which has effect on the accuracy of emissivity, such as ambient temperature, samples temperature and measured temperature of infrared imaging. Sample's emissivity are measured by infrared imaging, it shows that this method can improve the measuring accuracy of emissivity significantly. The measuring device and the process of this measuring technology are simple, and the result is precise. |
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