Study On Shape Detection Technology Of Mini Components Based On DSP Image Processing

Subminiature Accessory is widely used, and plays an important role in modern society. Most parts of household appliances, digital products etc. are subminiature accessories. Even in the large equipments, such as precision machine tools, crane, and so on. Hence, It has the important significance for checking the qualification of subminiature accessories on the pipeline quickly and accurately.Using tool microscope to observe zoomed image for manual measurement, is the traditional way of subminiature accessory detecting. It has the disadvantages of lower accuracy, poor stability, and low efficiency. A new method of detecting subminiature accessory based on DSP image processing technology is proposed in this paper. It can be used for detecting the qualification of geometry size and contour of mass subminiature accessories quickly. The main work is, by using CCD camera which is placed on the product line, collect images of subminiature accessory, and then use DSP image processor and computer image analysis & recognition technologies, quick detection of subminiature accessory geometry size can be realized. There are two main research works in this paper, one is collection and process of subminiature accessory image, another one is identification of subminiature accessory image.On the aspect of images collecting and processing. In order to detecting the qualification of subminiature accessory geometry size quickly and precisely, significant difference between background gray value and subminiature accessory gray value is needed when collecting images. And then, a series of processes will be proposed to determine candidate region of subminiature accessory images, for instance, image format transformation, noise reduction, edge detection, orientation, skew correction, segmentation etc.In the field of images identification, by analyzing the principle of common image matching method and implementation, a method for subminiature accessory detecting on the basis of binary image information comparison is put forward in this article. With lots of experiments, it can be proved that the method can meet the demand of industrial production, has faster speed than other image matching ways, and meet the requirement of on-line measurement of subminiature accessory.