Research On Adding Statistics And Output Function On DC Tester

RF (Radio Frequency) semiconductor is a complexed industry product that complicated production process, difficulty investigation and high cost. So it is a very important work for us to improve the production yield. But now there is no statistic and output function on the 9400 FET/TEST DC tester in my company. So engineers cannot help but manual statistic by sample when they analyse the test data for improving the yield. This way could arouse worse systematic, integrality and reliability. It is bad for RF production yield improving. Focus on this problem, my thesis is adding test data statistics and output function on DC test process by C language and actualizing the man-machine conversation by VB programe. This improving could systemic, integraly and reliable save the data and statistic the data follow the Statistical Process Control (SPC) theory. So engineers could effective and quickly improve the production yield follow the result of statistic data.First it is foreword segment, bring forward the thesis subject. Second it is introduction segment. One it introduce the key theory of statistic——Statistical Process Control (SPC), the other it introduce the hardware——9400 FET/TEST DC test system. Third it is actualize segment. First, I analyse the DC test file and then bring forward the holistic programe train of thought. Second, I programe the test data statistic and output function by C language. Third, I programe the dialog box to actualize the man-machine conversation by VB programe which could transfer the C language programe. Fourth it is result segment, I transfer the C and VB programe to the DC test system, try running it and outputting the result.I use the poplary and easy programe language C and VB in my thesis. In a short time, I finished the investigation work. It has been usded in fact production and the effection is very good.