MOS IC Reliability Assurance Data And Application Research

This paper aims to conduct research on ways and methods to assure and improve IC reliability, and the detailed application of MOS Integrated Circuits TM. It started with IC's life cycle Tub Curve, and based on the reliability assurance data with relevant analysis as well as evaluation results, we emphasized on the practical problems when conducting TM Integrated Circuits Engineering Application works. And from that point, we follow the route in doing the whole research.Based on our requirements with Integrated Circuits, the products should be eliminated of Early Failed parts before delivery; and the delivered parts should comply with requirements of operation reliability and life durability conditions. To reach such a objective, we have to conduct a lot of experiments, measurements, analysis and improvement, evaluation and token works. This paper firstly builds up a theoretical basis for reliability assurance data technology research,this include:Environmental Stress screening, Statistical Technology, Measurement Technology, Failure Analysis Technology and Product Life-cycle Evaluation, etc. No doubt that the Reliability Assurance Data Technology Theory had laid a solid basis for the engineering application of Reliability Assurance work..On the basis of theoretical analysis, and through borrowing example of MNOS Integrated Circuits TM, we initiated research on Aging Strength through Simultaneous monitoring of Ageing Experiment cycles and its analysis, hence further ensured screening rate against requirements; and we introduced application of ASL1000 Measurement System in designing hardware and software of TM circuits measurement, thus achieved automatic measurement and laid foundation for the latter data collection work and data analysis work; we also defined Key procedures as by the characteristics of TM circuits and conduct monitoring & evaluation of specific process in an statistical way. While carrying out typical failure analysis and improvement, we conducted Reliability Increment experiment and improved the process against failure analysis results, thus making the products reach desired reliability indexes.