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The Method Of Screening Optocouplers Based On The Low-frequency Electric Noise

Posted on:2007-09-04Degree:MasterType:Thesis
Country:ChinaCandidate:J ZhouFull Text:PDF
GTID:2178360212983807Subject:Materials Physics and Chemistry
Abstract/Summary:PDF Full Text Request
The optocoupler, which has merits of small volume, long life, the non-mechanical electronic contact, the strong anti-jamming and so on, is widely applied to the military and the astronautics domain. The noise has the close relations with the optocoupler interior defects, and it is a important factor in the optocoupler reliability, even device function. This paper studied the noise uses in the optocoupler reliability appraisal method based on the low-frequency noise. Burst noise severely influence optocouplers' reliability. Burst noise was used as physical criteria of screening optocouplers. A method of higher order statistics by use of analyzing optocouplers' noise was proposed. Based on statistic criteria of optocouplers, physical criteria of screening optocouplers and its application were studied. Physical criteria are superior to statistic criteria, and they don't need the large sample. Burst noise severely affect the reliability of optocouplers, burst noise can be used as the physical criteria to screen optocouplers. The test verified the feasibility and the validity of the method.
Keywords/Search Tags:optocoupler, low-frequency noise, physical criteria, higher order statistics
PDF Full Text Request
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