Research On The Application Software Of Higher-Order Statistics For Electrical Noise Analysis

The problems arising from the degradation of electron devices have become increasingly important due to the increased complexity of modern integrated circuits and systems, as far as quality control and the evaluation of the reliability of materials and devices are concerned. The technique of low frequency noise measurement, which is merited with preferable qualities such as being non-destructive, highly sensitive and requiring neither expensive instrumentations nor complicated procedures of undertaking, has been widely used in this research field. Similar to classical signal processing discipline, conventional electrical noise analysis procedures are based on the techniques of power spectrum analysis, however, the complicated interactions of various micro-scope structure evolutions could lead to noise with multiple non-conventional characteristics such as non-Gaussianity, non-linearity, non-stationarity, which are highly correlated with the degradation discourse. Although conventional techniques for electrical noise processing could do little to detect or analyze noises of this kind, a new mathematical tool adopted in modern signal processing techniques to analyze them is higher order statistics, namely higher order statistics analysis.A convenient software of higher-order statistics specified for electrical noise analysis is developed and initially debugged on Matlab 6.5 platform, according to the definitions and estimation algorithms of the higher-order statistics and programmes in reference. The estimations of frequently used higher order statistics are realized in this software, as well as the higher order statistics based algorithms for multiple applications such as testing of noises'non-Gaussianity, detection of quadratic phase coupling signals and testing of noises'non-stationarity. Then several simulated and/or experimental noise datas of different mechanisms——simulated shot noise data, simulated quadratic phase coupling noise data, metal Al interconnection electro-migration experiment 1/f noise data, MOSFET irradiation experiment 1/f noise data——are analyzed from different point of view, and the implications of the results are primarily discussed. The conclusions derived through the discourse could be of some reference values and potentially helpful to both learners and researchers interested in this field.