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The Research And Development Of Semiconductor Testing System Based On S3C44B0

Posted on:2007-07-02Degree:MasterType:Thesis
Country:ChinaCandidate:A M QiaoFull Text:PDF
GTID:2178360212965286Subject:Mechanical and electrical engineering
Abstract/Summary:PDF Full Text Request
With the great improvement in the field of packaging and testing of discrete semiconductors, it is quite necessary to develop the testing systems owned by domestic enterprises themselves. Combined with the project of Jiangsu Changjiang Electronics Technology Co., Ltd., a kind of semiconductor testing system which is based on the 32-bit high-powered ARM microprocessor S3C44B0 is developed in this thesis.The system and the testing host structures are designed on basis of analyzing the background of article and the function of the semiconductor testing system. Some kinds of embedded processors are compared, and the 32-bit ARM microprocessor S3C44B0 is chosen. The CPU board, the bus conversion board and the AD/DA board of the testing host are designed. Based on the hardware of the system, the programs about the technical parameters which are edited in PC and saved in testing host are designed. The control functions of the testing system are encapsulated too. Finally, by describing the function and structure about the sorting machine, the flow chart of the program that controls the sorting machine of the system is showed.The semiconductor testing system makes full use of the high-powered ARM microprocessor S3C44B0. It is testified that the system can meet the requirement of function. The system can also be improved by adding other function units.
Keywords/Search Tags:Discrete semiconductor testing system, embedded microprocessor, ARM, S3C44B0, Programmable Logic Controller
PDF Full Text Request
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