The Study Of Key Error Correction Technology Of Near-Field Measurement For Ultra-Low Side-Lobe Antenna

With rapid development of space technology and continual updating of communication device, the requisition for antennas becomes higher and higher. General method of Far-Field measurement of antenna has much difficulty in its implementing, even powerless sometimes. So people aspire after a way to calculate radicalization field of antenna by measuring its near field. Technology of near-field measurement of antenna is crystallization of the technical development of measurement of antenna in recent decades. And technology of metrical error correction is the focus of technology of near-field measurement. This paper mainly researches the technology of key error correction in planar near-field measurement of ultra-low side-lobe antenna.This paper firstly summarizes the method of the technology of Near-Field measurement, and introduces some main errors in planar near-field measurement of ultra-low side-lobe antenna, which affect measurement accuracy. It also brings forward the connection between the total error of measurement of ultra-low side-lobe antenna and the parameters of the antenna under test. Then it studies ontechnology of the key error-scanning position error correction in planarnear-field measurement of ultra-low side-lobe antenna. Through analysis and simulation, it shows errors-upper-bounds and magnitude of error of far-field pattern affected by position error. And then two methods are put forward to compensate position error and simulated by computer. The results of computer simulation prove the correctness and feasibility of the two methods.