The Research And Development Of Integrated Automatic Testing System Based On DSP

Presently, the requirement to a measuring and controlling system of its precision, large quantity data operation speed and real time processing is higher than before. SCM systems can't meet the demand well in many situations, and is being replacing by DSP systems. DSP system has remarkable performances, such as high operation speed, precision, and has already become a technical hotspot. In this paper, the features of a DSP system is introduced following the introduction of DSP chips' development history, applications and structure. An integrated automatic testing system based on DSP is designed, aiming at equipment testing in power system. TMS320F206 DSP chip of TI corp. is selected as the core processor and a high quality intelligent three-phase signal generator as well as a measuring system is included in this system. Three-phase signal is formed by program in this system, which has rich harmonic high to 24th, and its amplitude and phase can be adjusted arbitrarily. Electric parameters such as virtual value, power and phase can be real-time measured, besides harmonic analysis by means of FFT algorithm. This system can also adjust its output automatically to avoid its amplitude and phase being affected, while the number of equipment being tested is changed. The practicability of this system is quite good. The measure of producing high harmonic with high quality by means of DSP is emphatically researched. And the difficulty to produce high harmonic with high speed by means of microcontroller is overcome. And FFT operation is completed by means of interpolation while the data number in a signal period is not 2N.