The Study Of Automobile Malfunction Tester Based On ARM7 And OBD Ⅱ

As china's economic development, more and more families have cars and vehicle production increasing. Followed, vehicle maintenance will be an important research topic, and the demand for automobile malfunction tester will be increasing. The paper based on the study and analysis of OBDⅡstandards, using Samsung's ARM7-based processor S3C44B0X, select specific protocol chip TL718 with existing vehicle OBD system interface mode, research and design malfunction tester which approach of using embedded.This paper included the following:1. introduced the OBD system development and diagnostic standard protocols.2. general description the ARM architecture and introduced the characteristics and hardware resources of S3C44B0X processor.3. described the main hardware modules of the malfunction tester.4. analysis of the organizational structure of the kernelμC/OS-Ⅱ, described the designing of the Boot loader, the transplanting of theμC/OS-Ⅱ, the designing of the driver of man-machine interface and the embedding ofμC/GUI.5. designed a program module of multi-task master control, in order to achieve and display the fault information.The paper discussion of the theoretical and technical, and studied the malfunction tester based on OBDⅡ. The application of embedded RTOS, improved the timeliness and flexibility of the system, enhanced the scalability of the system and reduced the difficulty of software development.