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Atomic Characterization Of The Interface Between 2D-TMD Semiconductor And Metal

Posted on:2021-05-23Degree:DoctorType:Dissertation
Country:ChinaCandidate:R C LuoFull Text:PDF
GTID:1488306503498424Subject:Materials Science and Engineering
Abstract/Summary:PDF Full Text Request
Since the discovery and successful preparation of graphene,two-dimensional layered materials with atomic layer thickness have attracted unprecedented attention and interest.Among them,due to the unique semiconductor properties,two-dimensional transition metal chalcogenides(2D-TMDs)have great potential for future applications in the fields where traditional semiconductor materials are applicable.When 2D-TMDs are used in electronic devices such as field effect transistors,their contact with metal electrodes becomes a bottleneck restricting the performance of related devices.At the physical level,when ideal interface is formed between 2D-TMDs and metals,the electrical properties of the interface only depend on the metal work function and the semiconductor electron affinity.At the chemical level,however,it is difficult for 2D-TMDs and metals to form the ideal interface contacts.The deposition process of metal electrodes onto 2D-TMDs often damages their interfaces.Therefore,it is currently a hot research topic on making a perfect Van der Waals(vd W)contact between 2D-TMDs and metals,which could also avoid the loss of interface transmission performance caused by the Fermi level pinning(FLP).On the other hand,the research and development of 2D-TMDs semiconductors are very rapid that a lot of meaningful results have been achieved in various links such as material preparation,structural characterization and performance analysis.Among them,chemical vapor deposition(CVD)is the main method to prepare large-scale monolayer 2D-TMDs films.If a metal,e.g.,Au is used as the CVD substrate,2D-TMDs can be grown directly on the gold surface.However,there are few studies up to now on the interface between CVD-grown 2D-TMDs and their substrates,especially the atomic-scale analysis of their interface structures.In this research,continuous monolayer layer MoS2/WS2 film was successfully prepared on the surface of nanoporous gold(NPG)via CVD method.The interface structure and related changes between 2D-TMDs and Au were carefully characterized and analyzed at the atomic scale by Cs-corrected transmission electron microscope(TEM).The main research contents and findings are as follows:1.The CVD system with a three-temperature-zone tube furnace was built,and the preparation of 2D-TMDs by CVD was explored.(1)By controlling the reaction conditions,high-quality monolayer MoS2 films and nanosheets were prepared on glass substrates.(2)Using the same experimental conditions,monolayer MoS2 films/nanosheets were grown successfully on the surface of NPG.(3)XPS results show the difference between MoS2grown on glass and NPG substrates.There is strong charge transfer in the latter one,as well as a special Au-S phase.2.The atomic structure of the interface between 2D-TMDs and Au was characterized by STEM,where S was found to be participated into the reconstructed interface.(1)The monolyer MoS2 film covers across the NPG with abundant surfaces,and there is no visible chemical interaction between MoS2 and gold.(2)Viewing from[100]Au and[110]Audirections,the reconstructed layer at MoS2-Au(001)interface reveals an unexpected periodic structure.Owing to the experimental and simulation results,it is composed of Au4S4 monomer.(3)For the MoS2-Au(110)and MoS2-Au(111)interface,S-induced interface reconstruction could also be found confirmed by EELS results.3.The reconstructed MoS2-Au interface was further researched on how they formed and their effect to this system.(1)By shortening the CVD reaction time,a discontinuous monolayer MoS2 film was grown on the NPG surface,and it was found that the MoS2coating and protection are the key point for maintaining the Au-S reconstructed structures.(2)By controlling the CVD conditions,e.g.,the source materials,Mo/S ratios and temperatures,it was found that excessive S source is one of the most important one to help form the Au-S phase at the interface.(3)The Au-S reconstruction layer could in turn change affect the structural symmetry of MoS2 by dragging the S layer a little bit away from Mo layer in MoS2.(4)The interface reconstruction of MoS2-Au also changes the electronic structure and carrier transport properties of their system.4.The stability of the Au-S reconstructed phase between the MoS2-Au interface was studied and explored preliminarily.(1)After the outside exposure for 18 months,the reconstructed Au4S4 layer at MoS2-Au(001)interface kept well while parts of MoS2 has even been oxidated.(2)An extra Au thin film was deposited onto the MoS2-Au sample,during which the reconstructed Au4S4 layer also kept well without damage.(3)The reconstructed Au4S4 phase is sensitive under the irradiation of foced electron beam in TEM.It could be changed back to original Au(001)surface by“knocking on”the S atoms in Au-S bonds.In conclusion,a continuous and stable vd W interface was constructed between 2D-TMDs and Au by CVD method,and the reconstructed interface was well-studied,wiich paved a new way to design and develop new TMD-based device.
Keywords/Search Tags:semiconductor-metal interface, transition metal dichalcogenides, chemical vapor deposition, transmission electron microscopy, interface reconstruction
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