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Laser frequency stabilization to spectral hole burning frequency references in erbium-doped crystals: Material and device optimization

Posted on:2003-07-13Degree:Ph.DType:Dissertation
University:Montana State UniversityCandidate:Bottger, ThomasFull Text:PDF
GTID:1468390011980965Subject:Physics
Abstract/Summary:
Narrow spectral holes in the absorption lines of Er3+ doped crystals have been explored as references for frequency stabilizing external cavity diode lasers at the important 1.5 μm optical communication wavelength. Allan deviations of the beat signal between two independent stabilized lasers as low as 200 Hz over 10 ms integration time have been achieved using regenerative spectral holes in Er3+:Y2SiO5 and Er3+:KTP, while drift was reduced to ∼7 kHz/min by incorporating the inhomogeneous absorption line as a fixed reference. During active stabilization, the transient spectral hole was continuously regenerated as hole burning balanced relaxation. In contrast, persistent spectral holes in Er3+:D:CaF2, with lifetimes of several weeks, provided programmable and transportable secondary frequency references that maintained sub-kilohertz stability over several seconds and enabled 6 kHz stability over 1.6 × 103 s. The error signal was derived from the spectral hole transmission using frequency modulation spectroscopy. A servo amplifier applied fast frequency corrections to the injection current of the laser diode and slower adjustments to the piezo-driven feedback prism plate.; These stabilized lasers provide ideal sources for spectral hole burning applications based on optical coherent transients, where laser stability is required over the storage time of the material. Since the lifetime of the frequency reference is exactly the material storage time, this requirement is automatically met by using our technique. This was demonstrated in Er 3+:Y2SiO5 and successfully transferred to high-bandwidth signal processing applications.; The material Er3+:Y2SiO5 was optimized for these applications. The 4I15/2 and 4 I13/2 crystal field levels were site-selectively determined by absorption and fluorescence spectroscopy. The excited state lifetime was measured to be 11.4 ms for site 1 and 9.2 ms for site 2. Zeeman experiments and two-pulse photon echo spectroscopy as a function of magnetic field orientation were used to determine the anisotropic electronic g-values for both Er 3+ sites and established a preferred magnetic field orientation for minimizing homogeneous line broadening by spectral diffusion. The spectral diffusion was characterized by stimulated photon echo spectroscopy and successfully described with established theories. In a 0.02 atomic percent Er3+ :Y2SiO5 crystal at B = 0.8 T and T = 1.6 K, line broadening became significant after 10 μs, increasing the homogeneous linewidth from 7.5 kHz to 75 kHz after 120 μs. Spectral diffusion, primarily caused by direct phonon driven Er3+ spin-flips in the ground state, can be controlled to negligible levels with proper magnetic field strength and orientation, temperature, and erbium concentration. In optimizing Er 3+:Y2SiO5, the narrowest optical resonance in any solid-state material of 73 Hz was measured.
Keywords/Search Tags:Spectral, Frequency, Material, References, Sio, Laser
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