| In recent years, delay testing has become a very important problem. This dissertation addresses three testability considerations namely, the power consumption, test quality and fault coverage in delay fault testing. The transition fault and the path delay fault models have been used for the purpose of studying these problems. Effective design automation techniques have been proposed using efficient data structures. The exponential number of path delay faults are handled non-enumeratively in all the proposed methods. Experimental results demonstrate the advantage of the proposed techniques over existing methods. |
