Applications of frustrated total internal reflection for short interaction length devices in photonic integrated circuits

The use of frustrated total internal reflection in making short interaction length components to be utilized in photonic integrated circuits will be presented. In addition to traditional frustrated total internal reflection, the plane wave solutions for frustrated total internal reflection across an active medium are developed and presented. Devices based both upon the passive frustrated total internal reflection and enhance frustrated total internal reflection are presented. Analytical parameterization of the devices is presented along with numerical simulation results.