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Research On Key Technology Of Measuring Spacial D&P Datum Transferring System

Posted on:2007-02-05Degree:DoctorType:Dissertation
Country:ChinaCandidate:Q H HuangFull Text:PDF
GTID:1118360212957785Subject:Mechanical Manufacturing and Automation
Abstract/Summary:PDF Full Text Request
Measurement and determination technology of spacial direction and position (D&P) is the foundation of determinating the positionship between objects and geometric elements, and is an important field in spacial D&P precise measurement technique research as well. Relative theory, value transferring method and system realization are the foundation of spacial D&P measurement and determinaiton technology research.According to requirement of the preparing research project of China Bureau of Weights & Measures, "Verification method of code-bar grade rod" and different spacial D&P measurement apparatus measurement method research and system development of relative producing and measurement departments, taking code-bar grade rod and semiconductor laser apparatus for example, the forming process and principle of height datum by transferring were analyzed, and measurement methods and systems of these datum apparatus were developed and experimented. Measurement systems were designed, so feasible measurement methods were provided for new spacial D&P apparatus. Theoretic foundation was provided for setting up measurement specification of spacial D&P detection apparatus.The main content discussed in this dissertation is as follows:1. Working principle of apparatus forming natural datum such as: spot, line, plane of laser beam was researched. Semiconductor laser rotating track and cross laser beams were modeled and model based measuring method of spacial positioning datum line was proposed, after which, photoelectric system of detection and recognition automatically for datum line spacial status was developed, and apparatus system's error factors in forming spacial positioning datum line were analyzed. So, reference theory and method for the verification of semiconductor laser datum apparatus is provided.
Keywords/Search Tags:Spacial D&P, Code-bar grade rod, Graduation precision, Measurement and adjustment, Dynamic measurement
PDF Full Text Request
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