Bandwidth Characteristic Analysis Of Silicon-based Microring Electro-optical Modulator And Automated Testing Research

In recent years,silicon-based photonics has developed rapidly.Due to the abundant resources of silicon materials and compatibility with traditional CMOS processes,optoelectronic integration is possible.Electro-optical modulators are the core devices of optical communication,optical interconnection and optical signal processing.Large-scale optoelectronic integration requires the compact structure of optoelectronic devices,so the size of optoelectronic devices should be as small as possible.As one of the most classic optical structures in optics,the micro-ring resonator is only composed of a ring waveguide and a straight waveguide,and does not require a cavity surface,with a simple structure and small size.The modulator can support large-scale optoelectronic integration and has a wide range of applications.This paper mainly studies the high-speed signal analysis of silicon-based micro-ring electro-optical modulator and the automatic testing method of optoelectronic devices.The topic selection has important application value and broad application prospects.The main work completed in this paper includes:1.High-speed signal analysis is an important research content of silicon-based micro-ring electro-optic modulator.In this paper,an equivalent circuit model of silicon-based micro-ring electro-optic modulator is established and its spectral response is measured,and its bandwidth is calculated,which is consistent with the actual measured bandwidth.In comparison,the two are basically the same;the eye diagram simulated by MATLAB is also basically consistent with the measured eye diagram,so this high-speed signal analysis method is effective,and this method has important guiding significance for the design and improvement of silicon-based micro-ring electro-optic modulators.2.In the high-speed signal analysis of the silicon-based micro-ring electro-optic modulator,the work of the test part is carried out manually.In order to improve the test efficiency,two automatic test schemes for optoelectronic devices are studied in this paper.The first is to use the ADDA module of the 89C52 single-chip microcomputer for device driving and voltage acquisition.Although this work is not directly applied to the test and analysis of silicon-based micro-ring electro-optical modulators due to insufficient accuracy and stability,it achieves optical transmitter module TOSA(Transmiter Optical Sub-Assembly)driving and optical receiver module ROSA(Receiver Optical Sub-Assembly)output voltage acquisition;the second is to complete the remote control of Keysight E3631 A power supply and Yokogawa AQ6370C/D spectrometer.The first work is directly applied to the test analysis of the silicon-based micro-ring electro-optic modulator,which saves manpower and improves the test efficiency.58 figures,2 table,and 52 references.