Research On The Performance Degradation Law Of Electromagnetic Unlocking Mechanism Of Separation Electrical Connector In Storage Environment

As an indispensable electronic component in the model equipment system,the separation electrical connector is responsible for power transmission and signal control,and is used to realize the electrical connection and automatic disconnection of the model equipment with the ground equipment and the circuit between stages.There are two kinds of separation methods used to the separation electrical connectors: electromagnetic separation and mechanical separation,and the electromagnetic separation is widely used in the separation electrical connectors.The electromagnetic separation process of the separation electrical connector mainly includes two steps: unlocking and separating.As the key component to realize the unlocking function of the electrical connector,the performance of the electromagnetic unlocking mechanism is of great significance to the reliability of the separation electrical connector.In this paper,the electromagnetic unlocking mechanism of a certain type of separation electrical connector is taken as the research object,its performance degradation law in the storage environment is studied,and its reliable life in the storage environment is evaluated.The specific research content is as follows:According to the structure,material and functional requirements of the electromagnetic unlocking mechanism,combined with the storage profile of the model equipment system,the environmental effect analysis of the electromagnetic unlocking mechanism is carried out,and the main environmental stress affecting the performance degradation of the electromagnetic unlocking mechanism in the storage environment is determined to be temperature.Through the failure analysis of the electromagnetic unlocking mechanism,it is determined that the main failure mode is the unlocking failure caused by the decrease of the electromagnetic suction and the short circuit of the coil,and the decrease of the electromagnetic suction and the short circuit of the coil are caused by the degradation of the magnetic properties of the internal magnet and the aging of the coil insulation,and the causes of the degradation of the magnetic properties and the aging of the coil insulation are further analyzed.The performance index of the electromagnetic unlocking mechanism in the storage environment is determined to be the rated electromagnetic suction through the groping test.The accelerated degradation test scheme of electromagnetic unlocking mechanism with temperature as stress is formulated.The failure criterion of electromagnetic unlocking mechanism is determined by static analysis.According to the performance characteristics and test principles of the electromagnetic unlocking mechanism,a test device for rated electromagnetic suction and a test platform for response time were built,and a total of 3600 hours of accelerated degradation tests were carried out according to the test scheme and the corresponding performance test requirements.Using the collected accelerated degradation test data,the same parent distribution of the test samples was tested based on the A-D test method.The effect of temperature on the degradation rate and process of the electromagnetic unlocking mechanism is analyzed.The results show that the higher the temperature is,the faster the degradation rate of the rated electromagnetic suction of the electromagnetic unlocking mechanism is,and the fluctuation degree of the rated electromagnetic suction is greater during the degradation process.According to the characteristics of the performance degradation data of the electromagnetic unlocking mechanism,the performance degradation model of the electromagnetic unlocking mechanism is established by using Wiener random process,and the failure life of the electromagnetic unlocking mechanism is given to follow the inverse Gaussian distribution.An accelerated model characterizing the relationship between drift coefficient and diffusion coefficient and temperature is established by using Arrhenius model.Using the least square method and the maximum likelihood method to estimate the parameters of the degradation model and the acceleration model,the estimation results of the reliable life of the electromagnetic unlocking mechanism in the storage environment are given,and the reliability evaluation of the electromagnetic unlocking mechanism in the storage environment is realized.The applicability of the degradation model is verified by probabilistic graphical test method and Epps-Pully numerical test method.The validity of the accelerated model is verified by variance analysis and linear regression analysis of the drift coefficient and diffusion coefficient in the degradation model.By comparing and analyzing the performance of the test sample and the untested sample,the correlation test of the reasons for the degradation of the rated electromagnetic suction is carried out.The results show that the degradation of the rated electromagnetic suction of the electromagnetic unlocking mechanism in the storage environment is mainly caused by the decrease of the magnetic permeability of the magnet,which verifies the correctness of the failure analysis.